Search results for: C. Cagli
Microelectronics Reliability > 2017 > 76-77 > C > 178-183
Microelectronic Engineering > 2017 > 178 > C > 61-65
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-2.1 - PM-2.5
2016 IEEE International Electron Devices Meeting (IEDM) > 4.5.1 - 4.5.4
Solid-State Electronics > 2016 > 125 > C > 182-188
2015 IEEE International Electron Devices Meeting (IEDM) > 17.2.1 - 17.2.4
Solid State Electronics > 2013 > 84 > Complete > 155-159
Thin Solid Films > 2013 > 533 > Complete > 19-23
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
2012 International Electron Devices Meeting > 31.5.1 - 31.5.4