Search results for: Cora Salm
Microelectronics Reliability > 2017 > 76-77 > C > 136-140
Microelectronic Engineering > 2017 > 177 > C > 13-18
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 459 - 465
Nuclear Inst. and Methods in Physics Research, A > 2011 > 633 > Supplement 1 > S194-S197
Nuclear Inst. and Methods in Physics Research, A > 2011 > 628 > 1 > 133-137
Computational Materials Science > 2010 > 49 > 4 Supplement > S235-S238
IEEE Electron Device Letters > 2010 > 31 > 6 > 528 - 530
Microelectronic Engineering > 2009 > 86 > 4-6 > 761-764
Microelectronics Reliability > 2008 > 48 > 8-9 > 1139-1143
Microelectronics Reliability > 2007 > 47 > 4-5 > 577-580
Microelectronics Reliability > 2005 > 45 > 9-11 > 1425-1429