Search results for: Theo Smedes
2016 IEEE International Reliability Physics Symposium (IRPS) > 6A-5-1 - 6A-5-10
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2869 - 2875
Microelectronics Reliability > 2011 > 51 > 12 > 2129-2136
EOS/ESD Symposium Proceedings > 1 - 8
Microelectronics Reliability > 2010 > 50 > 1 > 26-31
Microelectronics Reliability > 2009 > 49 > 12 > 1465-1469
Microelectronics Reliability > 2009 > 49 > 12 > 1433-1439
Microelectronics Reliability > 2005 > 45 > 9-11 > 1425-1429