Search results for: N. Collaert
Materials Science in Semiconductor Processing > 2016 > 42 > Part 2 > 255-258
2015 IEEE International Electron Devices Meeting (IEDM) > 31.1.1 - 31.1.4
2015 IEEE International Electron Devices Meeting (IEDM) > 14.4.1 - 14.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
2015 IEEE International Electron Devices Meeting (IEDM) > 14.5.1 - 14.5.4
Journal of Crystal Growth > 2015 > 424 > Complete > 62-67
2015 IEEE International Reliability Physics Symposium > 5A.7.1 - 5A.7.6