Search results for: R. Beneyton
2017 IEEE International Reliability Physics Symposium (IRPS) > MR-3.1 - MR-3.6
2015 IEEE International Electron Devices Meeting (IEDM) > 8.6.1 - 8.6.4
2014 IEEE International Electron Devices Meeting > 3.9.1 - 3.9.3
2013 IEEE International Electron Devices Meeting > 13.3.1 - 13.3.4
Solid State Electronics > 2013 > 90 > Complete > 143-148
Solid State Electronics > 2013 > 88 > Complete > 15-20
Solid State Electronics > 2012 > 74 > Complete > 32-37
Microelectronic Engineering > 2011 > 88 > 7 > 1376-1379
Microelectronic Engineering > 2011 > 88 > 5 > 548-552
Applied Physics A > 2011 > 104 > 2 > 517-527
2010 International Electron Devices Meeting > 11.2.1 - 11.2.4