Search results for: Ling LI
2015 IEEE International Electron Devices Meeting (IEDM) > 10.4.1 - 10.4.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
IEEE Electron Device Letters > 2013 > 34 > 2 > 229 - 231
2015 IEEE International Electron Devices Meeting (IEDM) > 10.4.1 - 10.4.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
IEEE Electron Device Letters > 2013 > 34 > 2 > 229 - 231