Search results for: T. Kim
2012 International SoC Design Conference (ISOCC) > 200 - 203
2012 International SoC Design Conference (ISOCC) > 367 - 370
2012 IEEE International Reliability Physics Symposium (IRPS) > ME.3.1 - ME.3.6
IEEE Electron Device Letters > 2012 > 33 > 8 > 1207 - 1209
IEEE Electron Device Letters > 2012 > 33 > 9 > 1315 - 1317
IEEE Transactions on Applied Superconductivity > 2012 > 22 > 3 > 4201504
IEEE Transactions on Plasma Science > 2012 > 40 > 6-2 > 1768 - 1772
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1137 - 1143