Search results for: D. Tournier
Microelectronics Reliability > 2015 > 55 > 9-10 > 1542-1548
Microelectronics Reliability > 2014 > 54 > 9-10 > 2217-2221
Thin Solid Films > 2013 > 548 > Complete > 125-129
Diamond & Related Materials > 2013 > 35 > Complete > 24-28
Diamond & Related Materials > 2011 > 20 > 3 > 395-397
Proceedings of the 2010 American Contrl Conference > 1404 - 1409
2009 IEEE Energy Conversion Congress and Exposition > 1890 - 1894
2008 IEEE Power Electronics Specialists Conference > 3178 - 3183