Search results for: O. Ambacher
2016 46th European Microwave Conference (EuMC) > 1517 - 1520
2016 46th European Microwave Conference (EuMC) > 409 - 412
2016 46th European Microwave Conference (EuMC) > 564 - 567
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Growth and Defect Phenomena > 135-138
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Growth and Defect Phenomena > 131-134
physica status solidi (a) > 213 > 3 > 831 - 838
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 598 - 605
Electronics Letters > 2016 > 52 > 1 > 52 - 54