Search results for: S. Pae
International Journal of Steel Structures > 2016 > 16 > 4 > 1309-1317
2012 IEEE International Reliability Physics Symposium (IRPS) > 5C.1.1 - 5C.1.5
Electronics Letters > 2009 > 45 > 1 > 26 - 27
2007 IEEE International Electron Devices Meeting > 247 - 250
Microelectronics Reliability > 2006 > 46 > 1 > 63-68