Wyniki wyszukiwania dla: R. Singuaroli
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 10 > 3769 - 3777
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 107-116
Microelectronics Reliability > 2000 > 40 > 8-10 > 1461-1465