Search results for: V. Paciello
Measurement > 2017 > 106 > C > 46-52
Metrology and Measurement Systems > 2013 > Vol. 20, nr 4 > 705--714
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 12 > 3253 - 3261
Measurement > 2017 > 106 > C > 46-52
Metrology and Measurement Systems > 2013 > Vol. 20, nr 4 > 705--714
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 12 > 3253 - 3261