Search results for: Peng Cheng
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2573 - 2581
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3293 - 3297
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3318 - 3325
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 431 - 439
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 440 - 448
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3246 - 3252
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1492 - 1501
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 479 - 487