Search results for: Takashi Sato
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 607 - 615
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3645 - 3654
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.2.1 - 2F.2.5
DAC Design Automation Conference 2012 > 139 - 144