Search results for: Chao Chen
IEEE Electron Device Letters > 2017 > 38 > 1 > 48 - 51
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 4 > 204 - 208
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1371 - 1376
2011 International Reliability Physics Symposium > 4C.2.1 - 4C.2.5
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 945 - 952
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 623 - 630
IEEE Electron Device Letters > 2011 > 32 > 10 > 1373 - 1375
2010 International Electron Devices Meeting > 5.5.1 - 5.5.4