Search results for: Vasileios Tenentes
Journal of Electronic Testing > 2017 > 33 > 4 > 463-477
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1397 - 1407
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 3 > 324 - 328
Microelectronics Reliability > 2016 > 67 > C > 74-81
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2735 - 2744
Lecture Notes in Electrical Engineering > VLSI 2010 Annual Symposium > Emerging Devices and Nanocomputing > 217-230
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 12 > 2013 - 2024
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 9 > 1369 - 1382
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 12 > 2330 - 2335