Search results for: Yu Cao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2248 - 2257
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-5.1 - DG-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-5.1 - CR-5.4
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-2.1 - CR-2.4
IEEE Electron Device Letters > 2016 > 37 > 11 > 1466 - 1469
IEEE Electron Device Letters > 2016 > 37 > 3 > 269 - 271
IEEE Electron Device Letters > 2016 > 37 > 1 > 16 - 19
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 384 - 393
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 340 - 349
IEEE Electron Device Letters > 2012 > 33 > 7 > 976 - 978
IEEE Electron Device Letters > 2012 > 33 > 5 > 661 - 663
DAC Design Automation Conference 2012 > 283 - 288