Search results for: Ahmed Kamal Reza
Microelectronics Reliability > 2018 > 80 > C > 149-154
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3337 - 3345
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-5.1 - DG-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-2.1 - CR-2.4
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2597 - 2602
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1359 - 1367