Search results for: Jong-Ning Aoh
Procedia Engineering > 2017 > 207 > C > 1361-1366
Microelectronics Reliability > 2013 > 53 > 3 > 463-472
Journal of Electronic Materials > 2012 > 41 > 9 > 2621-2630
Journal of Electronic Materials > 2008 > 37 > 11 > 1742-1750
Microelectronics Reliability > 2006 > 46 > 2-4 > 449-458
Journal of Electronic Materials > 2006 > 35 > 9 > 1693-1700
Journal of Electronic Materials > 2004 > 33 > 4 > 300-311
Journal of Electronic Materials > 2004 > 33 > 4 > 290-299