Search results for: K. Chatty
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
Microelectronics Reliability > 2010 > 50 > 9-11 > 1367-1372
2009 31st EOS/ESD Symposium > 1 - 8
2009 31st EOS/ESD Symposium > 1 - 10
2009 31st EOS/ESD Symposium > 1 - 7
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) > 6A.1-1 - 6A.1-10
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) > 7A.2-1 - 7A.2-10