Search results for: Yves Blaquiere
Microelectronics Reliability > 2016 > 66 > C > 173-182
Integration, the VLSI Journal > 2016 > 55 > C > 129-137
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 6 > 751 - 762
IEEE Transactions on Circuits and Systems I: Regular Papers > 2015 > 62 > 10 > 2465 - 2475
Analog Integrated Circuits and Signal Processing > 2015 > 82 > 1 > 57-66
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 11 > 3135 - 3144
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3535 - 3542
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2013 > 3 > 4 > 581 - 591
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 11 > 2024 - 2033