Search results for: John P. Snyder
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3808 - 3815
The International Journal of Advanced Manufacturing Technology > 2012 > 58 > 5-8 > 563-572
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3808 - 3815
The International Journal of Advanced Manufacturing Technology > 2012 > 58 > 5-8 > 563-572