Search results for: Mujahid Muhammad
IEEE Transactions on Semiconductor Manufacturing > 2016 > 29 > 4 > 292 - 298
IEEE Access > 2016 > 4 > 7967 - 7987
EOS/ESD Symposium Proceedings > 1 - 6
Microelectronics Reliability > 2007 > 47 > 7 > 1069-1073