Search results for: Michael J. Uren
IEEE Electron Device Letters > 2018 > 39 > 1 > 55 - 58
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4044 - 4049
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2826 - 2834
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2155 - 2160
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1197 - 1202
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 977 - 983
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1861 - 1865
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2493-2498
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2464 - 2469
IEEE Electron Device Letters > 2015 > 36 > 8 > 826 - 828
Microelectronics Reliability > 2014 > 54 > 5 > 921-925
IEEE Electron Device Letters > 2014 > 35 > 3 > 327 - 329
physica status solidi (a) > 209 > 12 > 2646 - 2652
Microelectronics Reliability > 2012 > 52 > 12 > 2880-2883
IEEE Electron Device Letters > 2012 > 33 > 11 > 1550 - 1552
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3327 - 3333
Solid State Electronics > 2011 > 57 > 1 > 14-18
Solid State Electronics > 2002 > 46 > 4 > 529-537