Search results for: S. R. Hasan
Journal of Electronic Testing > 2013 > 29 > 4 > 457-471
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 8 > 2020 - 2031
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 10 > 2696 - 2707