Search results for: C. Thibeault
IEEE Transactions on Aerospace and Electronic Systems > 2016 > 52 > 2 > 681 - 697
Electronics Letters > 2015 > 51 > 10 > 762 - 763
Journal of Electronic Testing > 2013 > 29 > 4 > 457-471
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2959 - 2965
Journal of Electronic Testing > 2012 > 28 > 2 > 229-242
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 130 - 141