Search results for: J. Mitard
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 444 - 455
2012 International Electron Devices Meeting > 30.2.1 - 30.2.4
2012 International Electron Devices Meeting > 6.5.1 - 6.5.4
2012 International Electron Devices Meeting > 28.7.1 - 28.7.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.10
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.4.1 - 5A.4.6
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 384 - 391
IEEE Electron Device Letters > 2011 > 32 > 1 > 87 - 89
2010 International Electron Devices Meeting > 10.4.1 - 10.4.4
2010 International Electron Devices Meeting > 10.6.1 - 10.6.4