Search results for: X. Federspiel
Microelectronics Reliability > 2018 > 87 > C > 106-112
Microelectronics Reliability > 2018 > 80 > C > 100-108
Microelectronics Reliability > 2017 > 76-77 > C > 92-96
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-4.1 - 4C-4.7
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-9.1 - DG-9.4
Microelectronics Reliability > 2016 > 64 > C > 158-162
Microelectronics Reliability > 2016 > 64 > C > 163-167
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-9-1 - XT-9-4
2016 IEEE International Reliability Physics Symposium (IRPS) > 7C-1-1 - 7C-1-6
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-8-1 - XT-8-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-4-1 - 5A-4-6
2015 IEEE International Electron Devices Meeting (IEDM) > 20.5.1 - 20.5.6