Search results for: Tomonori Nishimura
Advanced Materials > 35 > 29 > n/a - n/a
Advanced Functional Materials > 32 > 9 > n/a - n/a
IEEE Electron Device Letters > 2017 > 38 > 6 > 716 - 719
IEEE Electron Device Letters > 2016 > 37 > 7 > 847 - 850
2014 IEEE International Electron Devices Meeting > 32.5.1 - 32.5.4
2014 IEEE International Electron Devices Meeting > 21.2.1 - 21.2.4
Thin Solid Films > 2014 > 557 > C > 272-275
Thin Solid Films > 2014 > 557 > C > 334-337
2013 IEEE International Electron Devices Meeting > 11.5.1 - 11.5.4
Microelectronics Reliability > 2013 > 53 > 5 > 741-747