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A 32-Gb ReRAM test chip has been developed in a 24-nm process, with a diode as the selection device and metal oxide as the switching element. The memory array is constructed with cross-point architecture to allow multiple memory layers stacked above the supporting circuitry and minimize the circuit area overhead. Die efficiency is further improved by sharing wordlines and bitlines between adjacent...
A miniature 40 GHz transceiver and radio front-end designed and simulated using a 0.13-μm RF CMOS process for Radio-over-Fiber applications is presented in this paper. The transceiver employs a direct-conversion architecture. The radio is designed for a frequency division duplex (FDD) communications system. PHY layer data rates as high as 1.5 Gbps on a wireless link are feasible using this radio design...
ReRAM has been considered as one of the potential technologies for the next-generation nonvolatile memory, given its fast access speed, high reliability, and multi-level capability. Multiple-layered architectures have been used for several megabit test-chips and memory macros [1–3]. This paper presents a MeOx-based 32Gb ReRAM test chip developed in 24nm technology.
There is growing interest in emerging non-volatile memory technologies such as Phase-Change Memory, Memristors, and Spin-Transfer Torque RAM (STT-RAM). STT-RAM, in particular, is experiencing rapid development that can be difficult for memory systems researchers to take advantage of. What is needed are techniques that enable designers to explore the potential of recent STT-RAM designs and adjust the...
Spin-Transfer Torque RAM (STT-RAM) has emerged as a potential candidate for Universal memory. However, there are two challenges to using STT-RAM in memory system design: (1) the intrinsic variation in the storage element, the Magnetic Tunnel Junction (MTJ), and (2) the high write energy. In this paper, we present a physically based thermal noise model for simulating the statistical variations of MTJs...
We present a physical compact model for magnetic tunnel junction (MTJ). Landau-Lifshitz-Gilbert (LLG) differential equation is solved in SPICE to derive the transient characteristics of MTJ. A modified version of the Simmons tunnel current equation captures the steady state properties of MTJ. The model results are validated with published experimental data.
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