Search results for: L. Goux
Microelectronic Engineering > 2017 > 179 > C > 56-59
Solid-State Electronics > 2016 > 125 > C > 189-197
IEEE Electron Device Letters > 2015 > 36 > 8 > 775 - 777
2015 IEEE International Reliability Physics Symposium > MY.11.1 - MY.11.3
Thin Solid Films > 2013 > 533 > Complete > 29-33