Search results for: L. Goux
Microelectronic Engineering > 2017 > 179 > C > 56-59
Microelectronic Engineering > 2017 > 178 > C > 93-97
Microelectronic Engineering > 2017 > 178 > C > 38-41
2016 IEEE International Electron Devices Meeting (IEDM) > 21.2.1 - 21.2.4
2016 IEEE International Electron Devices Meeting (IEDM) > 4.6.1 - 4.6.4
Solid-State Electronics > 2016 > 125 > C > 189-197
Solid-State Electronics > 2016 > 125 > C > 198-203
IEEE Electron Device Letters > 2016 > 37 > 9 > 1112 - 1115
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-1-1 - 6C-1-7
2015 IEEE International Electron Devices Meeting (IEDM) > 10.6.1 - 10.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
Microelectronic Engineering > 2015 > 147 > C > 171-175