Search results for: Gaudenzio Meneghesso
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2135 - 2141
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-2.1 - 3B-2.8
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-3.1 - WB-3.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3473 - 3478
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2334 - 2339
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2219 - 2222
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2549 - 2554
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 782 - 787
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4070 - 4077
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1987 - 1992
IEEE Electron Device Letters > 2014 > 35 > 4 > 443 - 445
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3166 - 3175
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3176 - 3182