Search results for: Gaudenzio Meneghesso
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
2014 IEEE International Reliability Physics Symposium > 6C.6.1 - 6C.6.7
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2199 - 2207
IEEE Electron Device Letters > 2014 > 35 > 10 > 1004 - 1006
2012 IEEE International Reliability Physics Symposium (IRPS) > 2C.2.1 - 2C.2.5
Journal of Electronic Materials > 2011 > 40 > 4 > 362-368
IEEE Transactions on Electron Devices > 2006 > 53 > 12 > 2932 - 2941