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In safety-critical cyber-physical systems, analog front-ends combined with many-processors are being increasingly employed. An example is an imminent collision detection chip for cars. Such a complex system requires zero downtime and a very high dependability despite aging issues under harsh environmental conditions. By on-line monitoring the health status of the processor cores and taking appropriate...
The increasing replacement of mechanical parts by x-by-wire systems in automotive applications allows improving driver safety. These systems demand highly dependable sensors that ensure their functionality despite the harsh operating conditions. This means that the sensors should be capable of working continuously despite catastrophic faults and keeping the performance over time. An anisotropic magnetoresistance...
In safety-critical systems, many-processor Systems-on-Chip are being increasingly employed. An example is an imminent collision detection System-on-Chip for cars. Such a system requires zero downtime and a very high reliability despite aging issues under harsh environmental conditions. By monitoring the health status of processor cores and other IPs, and taking appropriate counteractions if required,...
A cost-efficient framework for executing life-time dependability procedures is presented in this paper. The proposed framework relies on distributed sensors and actuators (embedded instruments) for self-awareness and adaptation, where the IEEE 1687 standard (iJTAG) is utilized for the dependability communications and the on-chip access of the instruments.
Electronic systems are replacing mechanical parts to improve the safety and performance of the cars. However, the electronic components should be dependable, meaning they should be trusted to work properly over time. AMR sensors are widely used in automotive for angle measurements. Nevertheless, they are affected by performance degradation and catastrophic faults. Both should be handled to guarantee...
The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting...
Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE...
The IEEE 1687 (IJTAG) is a newly IEEE approved standard to access embedded instruments. The usage of these embedded instruments (health monitors) is increasing in order to perform different online measurements for testing purposes as dependability is becoming a key concern in today's electronics. Aging and intermittent resistive faults (IRF) are two threats to a highly dependable system, and temperature...
This paper describes the usage of IDDX monitors, which provide (periodic) data to be employed for predicting the remaining life-time of processor cores in homogeneous multi-processor SoCs during their lifetime. This forms the basis of self-repair with no down time for these SoCs and dramatically improving their dependability. This goal is accomplished by combining the optimally designed health monitors,...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments could be used for managing the lifetime dependability of the chips. The IEEE 1687 (iJTAG) standard introduces an access network to the instruments based on reconfigurable scan paths. During lifetime, instruments could be required to initiate communication with a system-level dependability manager for...
Anisotropic Magnetoresistance (AMR) sensors are magnetic sensors often used for angle measurements. The sensor outputs should be two perfect sinusoidal signals that depend on the angle to be measured. However due to non-ideal properties of the sensor, the actual outputs include undesired parameters as offset voltage, amplitude imbalance and harmonics. All of them generate errors in the angle calculation...
Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge...
CPS, that consist of a cyber part – a computing system – and a physical part – the system in the physical environment – as well as the respective interfaces between those parts, are omnipresent in our daily lives. The application in the physical environment drives the overall requirements that must be respected when designing the computing system. Here, reliability is a core aspect where some of the...
A conventional technique to rise temperature in a processor involves the usage of thermal ovens or infrared techniques to heat up and then measure the temperature of the processor. However, local temperatures of each module cannot be controlled by these techniques. This paper presents a software mechanism to heat-up a processor while the temperature of each modules of the processor can precisely be...
The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults...
Anisotropic Magnetoresistance (AMR) sensors are often used for angle measurements. The sensor outputs consist of two sinusoidal signals that show undesired characteristics as offset voltage, amplitude imbalance and harmonics, which affect the angle measurements. These parameters change due to aging effects, but until now it is considered that these variations do not affect the sensor accuracy. The...
An Anisotropic Magnetoresistance (AMR) sensor is magnetic sensor often used to angle measurements. In case the sensor is configured with two Wheatstone bridges, it provides two sinusoidal outputs useful to calculate the angle of a magnetic field. However, due to non-ideal properties of the sensor, its output signals present undesired characteristics such as offset voltage, amplitude imbalance and...
IEEE 1687 (iJTAG) standard introduces a methodology for accessing the increasing number of embedded instruments found in modern System-on-Chips. Retargeting is defined by iJTAG as the procedure of translating instrument-level patterns to system-level scan vectors for a certain network organization. The analysis and the design of an on-chip retargeting engine is presented in this paper. Performing...
In this paper, critical path-delay time, and quiescent and transient power-supply current testing have been applied to a 90nm VLIW processor, to predict the remaining lifetime of this processor. The test environment for validation, via implementing an accelerated test has been realized. The resulting delay and current measurement data is presented next, followed by applying a genetic algorithm (GA)...
A compact negative bias temperature instability (NBTI) model is presented by iteratively solving the RD equations in a simple way. The new compact model can handle arbitrary stress conditions without solving time-consuming equations, and is hence, suitable for analogue/mixed-signal NBTI simulations in SPICE-like environments. The model has been implemented in Cadence ADE with Verilog-A and also takes...
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