Search results for: D. S. Ang
IEEE Electron Device Letters > 2016 > 37 > 5 > 644 - 647
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-1-1 - XT-1-3
IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
IEEE Electron Device Letters > 2016 > 37 > 9 > 1116 - 1119
IEEE Electron Device Letters > 2015 > 36 > 12 > 1291 - 1294
IEEE Electron Device Letters > 2015 > 36 > 8 > 748 - 750
2014 IEEE International Reliability Physics Symposium > XT.10.1 - XT.10.6
IEEE Electron Device Letters > 2013 > 34 > 2 > 295 - 297
IEEE Electron Device Letters > 2013 > 34 > 3 > 351 - 353
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.5.1 - 5A.5.5
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1013 - 1022
IEEE Electron Device Letters > 2012 > 33 > 4 > 486 - 488
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3133 - 3136
IEEE Electron Device Letters > 2012 > 33 > 2 > 146 - 148
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
2011 International Reliability Physics Symposium > XT.10.1 - XT.10.5