Search results for: Noohul Basheer Zain Ali
IEEE Sensors Journal > 2017 > 17 > 19 > 6279 - 6294
Journal of Electronic Testing > 2017 > 33 > 5 > 621-635
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 3 > 580 - 583
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 2 > 220 - 231
2013 International SoC Design Conference (ISOCC) > 388 - 391