Search results for: M. Aoulaiche
2009 IEEE International Reliability Physics Symposium > 1014 - 1018
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1690 - 1697
IEEE Electron Device Letters > 2009 > 30 > 12 > 1377 - 1379
IEEE Electron Device Letters > 2008 > 29 > 5 > 430 - 433
Microelectronics Reliability > 2007 > 47 > 6 > 880-889