Search results for: L. Goux
2016 IEEE International Electron Devices Meeting (IEDM) > 21.2.1 - 21.2.4
2016 IEEE International Electron Devices Meeting (IEDM) > 4.6.1 - 4.6.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1112 - 1115
2015 IEEE International Electron Devices Meeting (IEDM) > 10.6.1 - 10.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
IEEE Electron Device Letters > 2015 > 36 > 8 > 769 - 771
2015 IEEE International Reliability Physics Symposium > MY.11.1 - MY.11.3
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1499 - 1506