Wyniki wyszukiwania dla: Haiqing Nan
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 18 - 25
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 8 > 1540 - 1544
2012 International SoC Design Conference (ISOCC) > 351 - 354
Microelectronics Reliability > 2012 > 52 > 6 > 1209-1214
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 7 > 1445 - 1457
Microelectronics Reliability > 2011 > 51 > 12 > 2086-2092
2010 International SoC Design Conference > 123 - 126
2010 International SoC Design Conference > 115 - 118