Search results for: Juin J Liou
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
IEEE Electron Device Letters > 2016 > 37 > 11 > 1477 - 1480
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1061 - 1067
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2588 - 2594
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 864 - 868
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 772 - 774
IEEE Electron Device Letters > 2012 > 33 > 11 > 1595 - 1597
IEEE Electron Device Letters > 2012 > 33 > 6 > 860 - 862
IEEE Electron Device Letters > 2011 > 32 > 7 > 967 - 969
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2974 - 2980
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2736 - 2743
IEEE Electron Device Letters > 2010 > 31 > 9 > 915 - 917