Search results for: Juin J Liou
Microelectronics Reliability > 2017 > 78 > C > 307-310
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
IEEE Electron Device Letters > 2016 > 37 > 11 > 1477 - 1480
IEEE Electron Device Letters > 2016 > 37 > 10 > 1311 - 1313
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
Microelectronics Reliability > 2016 > 61 > C > 106-110
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 495 - 499
Microelectronics Reliability > 2015 > 55 > 1 > 15-23
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2588 - 2594
IEEE Electron Device Letters > 2013 > 34 > 12 > 1491 - 1493
IEEE Electron Device Letters > 2013 > 34 > 2 > 178 - 180
IEEE Transactions on Electromagnetic Compatibility > 2013 > 55 > 2 > 241 - 247
IEEE Electron Device Letters > 2012 > 33 > 6 > 893 - 895
IEEE Electron Device Letters > 2012 > 33 > 5 > 640 - 642
IEEE Electron Device Letters > 2012 > 33 > 11 > 1595 - 1597
IEEE Electron Device Letters > 2012 > 33 > 6 > 860 - 862
IEEE Electron Device Letters > 2012 > 33 > 10 > 1345 - 1347
IEEE Electron Device Letters > 2012 > 33 > 10 > 1360 - 1362