Search results for: Tetsuji Yasuda
Microelectronic Engineering > 2013 > 109 > Complete > 133-136
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 456 - 462
IEEE Transactions on Nanotechnology > 2013 > 12 > 4 > 621 - 628
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2512 - 2517
Microelectronic Engineering > 2011 > 88 > 12 > 3459-3461
Microelectronic Engineering > 2011 > 88 > 7 > 1087-1090
Thin Solid Films > 2011 > 519 > 9 > 2830-2833
IEEE Electron Device Letters > 2011 > 32 > 9 > 1218 - 1220
Surface Science > 2009 > 603 > 5 > 826-830
Applied Surface Science > 2008 > 254 > 23 > 7565-7568
Thin Solid Films > 2004 > 455-456 > Complete > 759-763
Applied Surface Science > 2001 > 171 > 3-4 > 252-256
Applied Surface Science > 2000 > 162-163 > 419-424
Applied Surface Science > 2000 > 162-163 > 299-303
Thin Solid Films > 1999 > 357 > 1 > 1-7