Search results for: B Vrignon
Microelectronics Reliability > 2013 > 53 > 9-11 > 1273-1277
Journal of Electronic Testing > 2012 > 28 > 3 > 339-348
Journal of Electronic Testing > 2012 > 28 > 6 > 791-802
2010 International SoC Design Conference > 21 - 24