Search results for: C. Claeys
Materials Science in Semiconductor Processing > 2012 > 15 > 6 > 588-600
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
IEEE Transactions on Semiconductor Manufacturing > 2007 > 20 > 3 > 215 - 221
IEEE Transactions on Electron Devices > 2006 > 53 > 8 > 1815 - 1820
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1959 - 1966