Search results for: Min Sun
IEEE Electron Device Letters > 2017 > 38 > 4 > 509 - 512
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 113 - 120
2015 IEEE International Electron Devices Meeting (IEDM) > 16.6.1 - 16.6.4
IEEE Electron Device Letters > 2013 > 34 > 3 > 369 - 371
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2115 - 2122
IEEE Electron Device Letters > 2012 > 33 > 7 > 982 - 984
IEEE Electron Device Letters > 2012 > 33 > 2 > 200 - 202
IEEE Transactions on Electron Devices > 2007 > 54 > 9 > 2546 - 2550