Search results for: Nathan Jack
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 792 - 800
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 379 - 387
2012 IEEE International Reliability Physics Symposium (IRPS) > 3E.2.1 - 3E.2.6
EOS/ESD Symposium Proceedings > 1 - 9
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 4 > 522 - 530