Search results for: Chih-Hong Hwang
The European Consortium for Mathematics in Industry > Scientific Computing in Electrical Engineering SCEE 2008 > Coupled Problems > 313-320
Microelectronics Reliability > 2010 > 50 > 5 > 657-661
Microelectronics Reliability > 2010 > 50 > 5 > 635-638
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 437 - 447
Microelectronic Engineering > 2009 > 86 > 3 > 277-282
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1588 - 1597
IEEE Transactions on Circuits and Systems II: Express Briefs > 2009 > 56 > 5 > 379 - 383
2008 8th IEEE Conference on Nanotechnology > 350 - 353