Search results for: E. Misra
2016 IEEE International Reliability Physics Symposium (IRPS) > 6B-4-1 - 6B-4-6
IEEE Electron Device Letters > 2009 > 30 > 11 > 1134 - 1136
Thin Solid Films > 2009 > 517 > 5 > 1833-1836
Microelectronics Reliability > 2006 > 46 > 12 > 2096-2103
Materials Letters > 2005 > 59 > 8-9 > 872-875
Thin Solid Films > 2005 > 474 > 1-2 > 235-244
Microelectronics Reliability > 2005 > 45 > 2 > 391-395
Thin Solid Films > 2004 > 457 > 2 > 338-345