Search results for: L. Zhang
2012 IEEE International Reliability Physics Symposium (IRPS) > 2D.4.1 - 2D.4.5
IEEE Electron Device Letters > 2012 > 33 > 6 > 875 - 877
IEEE Transactions on Magnetics > 2011 > 47 > 10 > 3139 - 3142
IEEE Transactions on Magnetics > 2011 > 47 > 10 > 4062 - 4065
IEEE Electron Device Letters > 2011 > 32 > 5 > 668 - 670